Conventional deep super-resolution (SR) imaging techniques — such as STORM, ExM, and STED — are typically limited to a working depth of around 30 microns. With patented RCM (REscan Confocal Microscopy) technology, it is now possible to achieve super-resolution imaging beyond 500 µm!
The new GAIA Point REscan module is the perfect solution to meet the NA/WD challenge, as it features a switchable pinhole that allows its confocality to be adapted to a wide range of objectives, from 30x to 100x.
