ST-VIS Thin Film Pack Spectrometers
Product description
Our Thin Film Pack meets all these criteria and offer our customers easy-to-use, highly accurate and very affordable measuring tools for metrology applications. It utilizes spectroscopic reflectometry to accurately determine optical and non-optical thin film thicknesses for applications in consumer, semiconductor, medical and industrial application. The system is able to measure optical thickness range from 10nm-100µm (+/- 0.1 nm).
- Modular: configurable to your application and needs within the wavelength range 350-1000 nm
- Easy to use: plug and play via the micro USB connection
- Test materials: Transparent or semi-transparent rapid data transfer is great for applications using chemometric models
- Versatile stage: for any substrates
- Powerfull software: real time measurements for on-line analysis
- Simple to use software: for a person who is not an expert in thin film
What’s included
- ST-VIS-25: Preconfigured spectrometer covering 350-850 nm, with 2.0 nm FWHM resolution
- HL-2000-LL: Halogen Light Source
- QP-400-1-SR-BX: Solarization Resistant Optical Fiber, 400 µm diameter, Stainless steel Jacket
- STAGE-RTL: Reflection & Transmission Stage
- STEP-Wafer: Si-SiO2 reference wafer, 100 mm diameter
- Nanocal-1: Thin film measurement software for Windows ; measurement, simulaton and single -layer analysis of up to 4 layers stack
- Rugged waterproof suitcase (524 x 428 x 206 mm)
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